AndTech 將舉辦半導體製程檢測與分析技術線上研討會

常見問題

Q: What is the main topic of the seminar?

A: The seminar's main topic is the overview and basic principles of inspection and analysis technologies in semiconductor processes, as well as the latest trends in new analysis technologies that combine light and electrons.

Q: When and how will the seminar be held?

A: The seminar will be held online via Zoom on Friday, May 22, 2026, from 13:00 to 16:30. The Zoom URL will be sent after registration.

Q: Who is the speaker?

A: The speaker is Hirokazu Fujiwara, from the Graduate School of Frontier Sciences at The University of Tokyo, and formerly from Kioxia. He specializes in condensed matter physics and has experience in device development at a semiconductor manufacturer.

Q: What will participants learn from this seminar?

A: Participants will learn about the basic principles and characteristics of inspection equipment like optical inspection devices, electron microscopes, and probe microscopes. They will also understand the types and characteristics of inspection technologies required in semiconductor processes, and the trends and future prospects of advanced semiconductor devices, processes, and the latest inspection/analysis technologies.

Q: What is the participation fee?

A: The participation fee is 45,100 yen (tax included). Materials will be distributed electronically.