What is the "National Metrology Institute of Japan Open Day"?

The "National Metrology Institute of Japan Open Day" is an event organized by the National Institute of Advanced Industrial Science and Technology (AIST) to showcase its research achievements in metrology and measurement technology, fostering collaboration with industry and research institutions.

What is the main focus of this specific webinar (Series 3)?

This webinar, Series 3, focuses on the latest measurement technologies for visualizing the nanoscale world, including techniques for thin films, SEM observation, particle size measurement, synchrotron X-ray analysis, and positron annihilation spectroscopy for void detection.

Who is the target audience for this webinar?

The webinar is recommended for professionals involved in thin film evaluation, semiconductor device thermal design, SEM observation, particle measurement, material evaluation using synchrotron X-rays, and void evaluation in materials.

Is there a participation fee for this webinar?

No, the participation fee for this webinar is free.

How can I watch the webinar?

The webinar will be broadcast online, and viewing is possible through a web browser.

Will the content be the same on both broadcast dates?

Yes, the content broadcast on April 13th and April 16th will be the same.

AI News NQ Analysis

【重要】（产总研集团/免费研讨会）「计量标准综合中心开放日」计量标准链接产业应用系列第三弹测量与观察纳米世界 - 以测量技术开创材料评估与产业应用的未来【4/13・16播出】

尚無 AI 分析資料。

常見問題

Q: What is the "National Metrology Institute of Japan Open Day"?: A: The "National Metrology Institute of Japan Open Day" is an event organized by the National Institute of Advanced Industrial Science and Technology (AIST) to showcase its research achievements in metrology and measurement technology, fostering collaboration with industry and research institutions.
Q: What is the main focus of this specific webinar (Series 3)?: A: This webinar, Series 3, focuses on the latest measurement technologies for visualizing the nanoscale world, including techniques for thin films, SEM observation, particle size measurement, synchrotron X-ray analysis, and positron annihilation spectroscopy for void detection.
Q: Who is the target audience for this webinar?: A: The webinar is recommended for professionals involved in thin film evaluation, semiconductor device thermal design, SEM observation, particle measurement, material evaluation using synchrotron X-rays, and void evaluation in materials.
Q: Is there a participation fee for this webinar?: A: No, the participation fee for this webinar is free.
Q: How can I watch the webinar?: A: The webinar will be broadcast online, and viewing is possible through a web browser.
Q: Will the content be the same on both broadcast dates?: A: Yes, the content broadcast on April 13th and April 16th will be the same.