ZEISS Unveils New 'Crossbeam 750' FIB-SEM: High-Efficiency TEM Lamella Prep via Live SEM Imaging and High-Resolution Observation with Gemini 4 Optics
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ZEISS has announced the launch of the Crossbeam 750, a new FIB-SEM designed for high-precision sample preparation. Featuring the newly developed Gemini 4 electron optics and enhanced Live SEM Imaging, it allows for real-time high-resolution observation without interrupting FIB processing, drastically improving the success rate of TEM sample preparation in semiconductor analysis.