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Toray Research Center Launches High-Sensitivity Analysis Service for Impurity Nanoparticles in Chemicals, Supporting Expanding Semiconductor Demand in the AI Era

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Toray Research Center (TRC) has developed a new technology for highly sensitive analysis of impurity metal nanoparticles in chemicals used in semiconductor manufacturing processes. The company has launched a contract analysis service utilizing this technology, aiming to contribute to improved semiconductor yield and higher purity.

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Frequently Asked Questions

Q: What issues does this analysis service address?
A: It prevents potential breaks and short circuits caused by impurity nanoparticles due to semiconductor miniaturization, contributing to improved manufacturing yield.
Q: What is spICP-MS technology?
A: It is a highly sensitive analysis method that can detect individual metal nanoparticles in a liquid and simultaneously measure particle size and concentration.
Q: What types of companies should use this service?
A: It is suitable for semiconductor manufacturers, semiconductor material makers, and companies that require high-purity chemical management.