What inspection techniques can we learn in this seminar?

In addition to the basic principles of optical inspection devices, electron microscopes, and probe microscopes, you can learn about the latest analysis methods that combine light and electrons.

What is the background of the instructor?

Mr. Kiyoshi Fujiwara, who has experience in device development at Kioxia and is currently a specialist in condensed matter physics at the University of Tokyo.

When and where will the seminar be held?

The seminar will be held online via Zoom from 13:00 to 16:30 on May 22, 2026.

AI News NQ Analysis

AndTech Announces Zoom Seminar: "Overview and Basic Principles of Inspection & Analysis Technologies in Semiconductor Processes, and Latest Trends in New Analysis Techniques Combining Light and Electrons" Scheduled for Friday, May 22

NQ Score 73/100

N1 Content Completeness 8

AI Summary (NQ-processed)

AndTech will host a Zoom seminar on May 22, 2026, aimed at engineers dealing with semiconductor processes, featuring a lecture by Hirokazu Fujiwara of the University of Tokyo on cutting-edge inspection technologies combining light and electrons.

AI Analysis

Frequently Asked Questions

Q: What inspection techniques can we learn in this seminar?: A: In addition to the basic principles of optical inspection devices, electron microscopes, and probe microscopes, you can learn about the latest analysis methods that combine light and electrons.
Q: What is the background of the instructor?: A: Mr. Kiyoshi Fujiwara, who has experience in device development at Kioxia and is currently a specialist in condensed matter physics at the University of Tokyo.
Q: When and where will the seminar be held?: A: The seminar will be held online via Zoom from 13:00 to 16:30 on May 22, 2026.