What is the full name of the organization hosting the NMIJ Open Day webinar series on April 13 and 16?

The National Metrology Institute of Japan at the National Institute of Advanced Industrial Science and Technology is hosting the NMIJ Open Day webinar series on April 13 and 16.

When was the first in-person NMIJ Open Day event held under its new name in 2026?

The first in-person NMIJ Open Day event under its new name was held on January 29, 2026, at the National Metrology Institute of Japan.

How many distinct measurement technology topics are featured in the third series of the NMIJ Open Day webinar?

The third series of the NMIJ Open Day webinar features five distinct measurement technology topics related to nanoscale visualization and material evaluation.

What specific measurement capability does the multi-angle SEM observation technology provide for sample analysis?

The multi-angle SEM observation technology enables accurate capture of sample information by observing materials from multiple angles in scanning electron microscopy.

Which type of non-destructive measurement technology is used to detect atomic-level lattice defects in materials according to the article?

Vacancy measurement technology using positrons is used to non-destructively detect atomic-level lattice defects in materials at the National Metrology Institute of Japan.

AI News NQ Analysis

(AIST Group/Free Webinar) "NMIJ Open Day" Industrial Applications Connected by Metrology, Series 3: Measuring and Visualizing the Nano World – Future of Material Evaluation and Industrial Application Pioneered by Measurement Technology [Streaming April 13 & 16]

NQ Score 50/100

AI Summary (NQ-processed)

The National Metrology Institute of Japan (NMIJ) is hosting a webinar series featuring the latest measurement technologies for visualizing the nanoscale world. This event, a rebroadcast of the NMIJ Open Day, covers five key topics ranging from thermal diffusion measurement to positron-based vacancy analysis, aimed at supporting industrial material evaluation and innovation.

AI analysis data is not yet available.

Frequently Asked Questions

Q: What is the full name of the organization hosting the NMIJ Open Day webinar series on April 13 and 16?: A: The National Metrology Institute of Japan at the National Institute of Advanced Industrial Science and Technology is hosting the NMIJ Open Day webinar series on April 13 and 16.
Q: When was the first in-person NMIJ Open Day event held under its new name in 2026?: A: The first in-person NMIJ Open Day event under its new name was held on January 29, 2026, at the National Metrology Institute of Japan.
Q: How many distinct measurement technology topics are featured in the third series of the NMIJ Open Day webinar?: A: The third series of the NMIJ Open Day webinar features five distinct measurement technology topics related to nanoscale visualization and material evaluation.
Q: What specific measurement capability does the multi-angle SEM observation technology provide for sample analysis?: A: The multi-angle SEM observation technology enables accurate capture of sample information by observing materials from multiple angles in scanning electron microscopy.
Q: Which type of non-destructive measurement technology is used to detect atomic-level lattice defects in materials according to the article?: A: Vacancy measurement technology using positrons is used to non-destructively detect atomic-level lattice defects in materials at the National Metrology Institute of Japan.