[Important] (AIST Group/Free Seminar) "National Metrology Institute of Japan Open Day" Series 3: Measuring and Observing the Nanoworld - Pioneering the Future of Material Evaluation and Industrial Applications with Measurement Technology [April 13 & 16 Broadcast]

Frequently Asked Questions

Q: What is the "National Metrology Institute of Japan Open Day"?

A: The "National Metrology Institute of Japan Open Day" is an event organized by the National Institute of Advanced Industrial Science and Technology (AIST) to showcase its research achievements in metrology and measurement technology, fostering collaboration with industry and research institutions.

Q: What is the main focus of this specific webinar (Series 3)?

A: This webinar, Series 3, focuses on the latest measurement technologies for visualizing the nanoscale world, including techniques for thin films, SEM observation, particle size measurement, synchrotron X-ray analysis, and positron annihilation spectroscopy for void detection.

Q: Who is the target audience for this webinar?

A: The webinar is recommended for professionals involved in thin film evaluation, semiconductor device thermal design, SEM observation, particle measurement, material evaluation using synchrotron X-rays, and void evaluation in materials.

Q: Is there a participation fee for this webinar?

A: No, the participation fee for this webinar is free.

Q: How can I watch the webinar?

A: The webinar will be broadcast online, and viewing is possible through a web browser.

Q: Will the content be the same on both broadcast dates?

A: Yes, the content broadcast on April 13th and April 16th will be the same.