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(AIST Group / Free Seminar) 'NMIJ Open Day' Industrial Applications Connected by Measurement Standards Series 3: Measuring and Visualizing the Nanoscale World - The Future of Material Evaluation and Industrial Application Pioneered by Measurement Technology [Broadcast April 13 & 16]

NQ Score 70/100
N1 Content Completeness 8

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The National Metrology Institute of Japan (NMIJ) at AIST will host a free webinar on April 13 and 16, 2026, showcasing cutting-edge nanoscale measurement technologies to solve industrial challenges in material evaluation and quality control.

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Frequently Asked Questions

Q: When will the NMIJ Open Day webinars be held?
A: The webinars will be held on April 13, 2026 (Monday) from 10:00 to 11:30 and on April 16, 2026 (Thursday) from 15:00 to 16:30. The content will be the same on both days.
Q: What is the participation fee for this seminar?
A: The participation fee is free, and the seminar can be viewed online via a browser.
Q: What technologies will be introduced?
A: The latest trends in semiconductor thermal management, SEM observation techniques, particle size measurement, synchrotron radiation X-ray analysis, and positron-based void measurement will be introduced.